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Product Details:
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| Highlight: | Dry-Wet Integrated Laser Analyzer,Integrated Laser Analyzer |
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The NKT6200-B is an upgraded model of the 6100-B, offering higher measurement accuracy and a larger measuring range. Designed for laboratories of large enterprises, universities, and research institutes, it is suitable for powder applied research, new material development, powder quality control, process optimization, and similar applications.
The instrument incorporates multiple innovative patented technologies, featuring a three-lens optical system with side and backward detector arrays that significantly broaden the measurement range and enhance instrument performance. A fifth-generation ultra-high-speed acquisition motherboard ensures complete and accurate scattering signal collection.
Key features include industry-leading one-click dry/wet dispersion switching (seamless transition within 1 second), proprietary Laser Intelligent Management System (LIMS) for extended laser life, and residue-free pipeline design that prevents sedimentation and ensures zero sample residue after testing.
| Parameter | Specification |
|---|---|
| Measurement Principle | Full-range laser diffraction |
| Particle Size Range | 0.1 μm – 3000 μm / 0.01 μm – 3000 μm (full-range measurement) |
| Detector System | 146/157 channels, uniform cross and area-compensated multi-direction array |
| Switching Mode | One-key automatic dry/wet switching; completes within 2 seconds |
| Dual Lasers | Imported high-performance laser (635 nm, 20 mW) and high-power semiconductor laser (405 nm, 20 mW) |
| Measurement Accuracy | Better than ±0.5% (NIST traceable reference material) |
| Measurement Time | Typical <10 seconds |
| Applicable Standards | ISO 13320-2020, GB/T 19077-2024, GB/T 41949-2022 |
| Dimensions | 1040 mm * 505 mm * 335 mm |
| Instrument Weight | 50 kg |
Built-in editable SOP enables automatic execution of entire test process with single key press, eliminating procedural variations and ensuring consistent results across different operators.
Industry-leading switching system enables seamless transition between test modes within 1 second without hardware replacement or waiting time.
Advanced system provides precise intelligent control of laser source, extending service life and reducing standby power consumption.
Fifth-generation acquisition motherboard with 10,000 samples per second ensures comprehensive, omission-free capture of particle scattering signals.
Proprietary three-lens optical system ensures precise and stable optical path for high-precision particle size measurement.
Excellent repeatability with measurement results consistently maintained within narrow error margins, providing stable and reliable particle size distribution data.
For further information or to discuss your specific requirements, please contact us directly.
Contact Person: Miss. Scarlett.S
Tel: 8616602956098